Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose
نویسندگان
چکیده
منابع مشابه
New possibilities with aberration-corrected electron microscopy.
Unlike light microscopy, where resolution is diffraction limited, the achievable resolution of electron microscopes is limited by lens aberrations so severe that the practical resolution is orders of magnitude worse than the diffraction limit. About 10 years ago, the first practical electron lens spherical aberration correctors were developed, and in the past decade, their performance, versatil...
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Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial imag...
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Recent developments in aberration control in the TEM have yielded a tremendous enhancement of direct imaging capabilities for studying atomic structures. However, aberration correction also has substantial benefits for achieving ultra-resolution in the TEM through reciprocal space techniques. Several tools are available that allow very accurate detection of the electron distribution in surfaces...
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Aberration correction in the TEM is now relatively well established with more than 20 corrected instruments installed worldwide. This paper will review these instrumental advances and will also describe the underlying theory and computation required to optimise data acquisition and interpret aberration corrected images. Finally the combination of direct electron optical correction and indirect ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2019
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927619009784